Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Filters
Results by year
Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2011 | 1 |
2017 | 1 |
2021 | 1 |
2022 | 1 |
2024 | 0 |
Search Results
4 results
Results by year
Filters applied: . Clear all
Page 1
Phase transitions and (p-T-X) behaviour of centrosymmetric perovskites: modelling with transformed crystallographic data.
Acta Crystallogr B Struct Sci Cryst Eng Mater. 2022 Feb 1;78(Pt 1):40-60. doi: 10.1107/S2052520621012713. Epub 2022 Jan 20.
Acta Crystallogr B Struct Sci Cryst Eng Mater. 2022.
PMID: 35129119
Free PMC article.
A reversible transformation of the unit-cell parameters and atomic coordinates of centrosymmetric perovskites ABX(3) into a Cartesian space is defined. ...The pressure evolution of the structures of MgSiO(3), YAlO(3), (La(1-x)Nd(x))GaO(3) (0 x 1) and YAl(0.25 …
A reversible transformation of the unit-cell parameters and atomic coordinates of centrosymmetric perovskites ABX(3) into a Cartesian …
Stability and structural evolution of Ce(IV)(1-x)Ln(III)(x)O(2-x/2) solid solutions: a coupled μ-Raman/XRD approach.
Horlait D, Claparède L, Clavier N, Szenknect S, Dacheux N, Ravaux J, Podor R.
Horlait D, et al.
Inorg Chem. 2011 Aug 1;50(15):7150-61. doi: 10.1021/ic200751m. Epub 2011 Jun 29.
Inorg Chem. 2011.
PMID: 21714501
Moreover, since Nd(2)O(3) does not crystallize with the Ia 3-type structure, two-phase systems composed with additional hexagonal Nd(2)O(3) were obtained for x(Nd) 0.73 in the Ce(1-x)Nd(x)O(2-x/2) series. The effect of heat treatment temperature on the …
Moreover, since Nd(2)O(3) does not crystallize with the Ia 3-type structure, two-phase systems composed with additional hexagonal Nd(2)O(3) …
Item in Clipboard
Evaluation of the Defect Cluster Content in Singly and Doubly Doped Ceria through In Situ High-Pressure X-ray Diffraction.
Artini C, Massardo S, Carnasciali MM, Joseph B, Pani M.
Artini C, et al.
Inorg Chem. 2021 May 17;60(10):7306-7314. doi: 10.1021/acs.inorgchem.1c00433. Epub 2021 Apr 30.
Inorg Chem. 2021.
PMID: 33929819
Free PMC article.
Data derived from a high-pressure X-ray diffraction investigation performed on the Ce(1-x)(Nd(0.74)Tm(0.26))(x)O(2-x/2) system are employed to develop a novel approach aimed at evaluating the defect aggregate content; the results are critically discussed in comparis …
Data derived from a high-pressure X-ray diffraction investigation performed on the Ce(1-x)(Nd(0.74)Tm(0.26))(x)O(2-x/2) system …
Item in Clipboard
All-Aluminum Thin Film Transistor Fabrication at Room Temperature.
Yao R, Zheng Z, Zeng Y, Liu X, Ning H, Hu S, Tao R, Chen J, Cai W, Xu M, Wang L, Lan L, Peng J.
Yao R, et al.
Materials (Basel). 2017 Feb 23;10(3):222. doi: 10.3390/ma10030222.
Materials (Basel). 2017.
PMID: 28772579
Free PMC article.
Alumina (Al2O3) insulating layer was deposited on the surface of aluminum doping zinc oxide (AZO) conductive layer, as one AZO/Al2O3 heterojunction unit. The measurements of transmittance electronic microscopy (TEM) and X-ray reflectivity (XRR) revealed the smooth interfac …
Alumina (Al2O3) insulating layer was deposited on the surface of aluminum doping zinc oxide (AZO) conductive layer, as one AZO/Al2O3 heteroj …
Item in Clipboard
Cite
Cite